To clarify the origin of the difference in the resistivity, at first we need to identify the presence of different ordered phases and characterize them looking at the XRD patterns collected before and after the annealing treatment. Diffraction data point out the presence of Tozasertib body-centered cubic crystal Mo phase with preferred orientations . Almost all spectra contain contributions due to different crystallographic orientations of the Mo phase (see Fig. 3), the most intense being the Mo(110) at ~ 16°, the Mo(200) at ~ 23° and the Mo(211) at ~ 28°. At low angles (< 15°) other structures with different intensities can be detected: the most intense peak of the Mo dioxide phase (~ 13.5° — see the MoO2 spectrum in Fig. 3) and the sapphire substrate (~ 14° and ~ 17°). Small contributions at ~ 12 and ~ 14.5° have not been assigned. However, a strained anisotropy growth and structural defects could be probably associated to somatic nervous system peaks.