Fig xA SEM TEM images of nanocrystalline

In other words, the graphene materials can encounter undesired defects resulting from the transfer process, in the form of wrinkles, cracks, etc. The resulting data may be associated with the process defects in the transferring process. Although the established protocols have been successfully applied to the materials, the number of graphene layers is identified through the relative comparison of the intensity of 2D- and G-bands observed in Raman spectra.