The SW MCR technique allows extracting detailed information of the
The crystal structure of the films was studied using grazing incidence diffraction (GID) of X-ray diffraction (XRD) by utilizing Bruker D8 Discover diffraction device. Raman spectroscopy using argon-ion laser with a wavelength of 488 nm was used to study the crystal symmetry of the samples by utilizing HORIBA Jobin Yvon LabRAM HR800 device. Scanning SKLB610 microscopy (SEM) studies were carried out by using Helios Dual-Beam FIB/FESEM device. Thermo Fisher Scientific ESCALAB 250Xi X-ray photoelectron spectroscopy (XPS) device was used to study the valence states of the thin-film surfaces. The surface morphology was studied using Veeco Dimension 3100 atomic force microscope (AFM).
3. Results and discussion
3.1. Structural characterization of the bioluminescent thin films
Fig. 1. a) Raman spectroscopy and b) the grazing incidence X-ray diffraction results of the vanadium oxide thin films. The films with only V2O5 phase were deposited at 400 °C and in p(O2) = 6 ×10−2 mbar (red curves), and the films deposited at 500 °C and in p(O2) = 1.5 ×10−2 mbar contained also V7O16 phase (black curves). The gray circles in (a) present Raman modes originating from V7O16 phase.Figure optionsDownload full-size imageDownload as PowerPoint slide