Fig. 4. Inferred bulk strain along the  growth direction directly mirrors the composition profile shown in Fig. 3.Figure optionsDownload full-size imageDownload as PowerPoint slide
As already noted, controlled navigation across the entire multilayer stack illustrated in Fig. 1 is easily achieved with STM. Comparison of early-, middle-, and late-period surveys from distinct cleaves at multiple locations on the same wafer reveals an increase in the incorporated antimony per period from beginning to end in each case.