Table summarises the activation energies capture cross

Table 1 summarises the activation energies, capture cross-sections and concentrations of the defects extracted for all samples considered in this study. One can observe that the concentration of the EL2 defect (having an energy ~0.8 eV) increases as the annealing temperature is raised to 500 °C. However, as the annealing temperature is increased to 600 °C the ~0.8 eV defect dissociates to form EL3 trap with a concentration of 3.66×1014 cm−3.