Fig xA Schematic illustration of

The surface and cross-sectional morphology of E-MWCNT layer was observed by field emission-scanning Rucaparib microscopy (FE-SEM, JEOL JSM-6700F). The transmission electron microscopy (TEM) was observed by (TEM, JEOL JEM-2100F) at accelerating voltage of 200 kV. Intensities of carbon and oxygen peaks, at the surface of E-MWCNT were measured through X-ray photoelectron spectroscopy (XPS) using Multi lab ESCA 2000 system VG from Thermo scientific, USA.