Changes in crystal deterioration between deposition temperatures of xA deg

In the curves for samples grown 'Talampanel(LY300164)' at temperatures ≤505 °C, coinciding angular positions of the SL peaks indicate the target In composition of ~20% and MQW Talampanel(LY300164) of ~16 nm. Interference patterns with clear SL peaks and interference fringes over a wide angular range correspond to a total MQW thickness of 80 nm and low deterioration of vertical coherence. RSMs reveal low density of diffuse scattered radiation and zero relaxation of the initial elastic stress.