The deliberate tailoring of optical

Accurate knowledge concerning the as-grown atomic arrangements responsible for the confining potentials that Ro3280 make these structures unique is rarely available.
Here, we show how atomic-resolution scanning tunneling microscopy (STM) may be used to reconstruct the monolayer-by-monolayer composition profile throughout one such structure, an InAs0.67Sb0.33 strained-layer superlattice (Fig. 1), following cleavage in ultra-high vacuum (UHV). We also show how STM may be used to quantify the changes in superlattice composition as growth progresses from beginning to end by selectively examining a subset of periods at various points along the multilayer stack.