The peak shift and line broadening in PXRD profiles
5 shows the excitation spectra of CeO2 NPs by monitoring the emission at 425 nm. The excitation spectra consists of a sharp peak at 388 nm corresponding to intra-configuration (f–f) transitions of Ce4+ ions.
Fig. 5. PL emission spectra of CeO2 NPs obtained with different LA leaf extract concentration excited at 388 nm (inset: variation of PL intensity of CeO2 NPs versus LA concentration in ml and excitation spectra of CeO2 sample S4).Figure optionsDownload full-size imageDownload as PowerPoint slide